更新時間:2023-11-25
esd靜電(dian)(dian)(dian)(dian)放(fang)電(dian)(dian)(dian)(dian)發生(sheng)器(qi)抗擾度試驗主要檢(jian)查(cha)人或物體在接觸(chu)設備時(shi)(shi)所(suo)引起(qi)的放(fang)電(dian)(dian)(dian)(dian)(直接放(fang)電(dian)(dian)(dian)(dian))以及人或物體對(dui)設備鄰近(jin)物體的放(fang)電(dian)(dian)(dian)(dian)(間接放(fang)電(dian)(dian)(dian)(dian))時(shi)(shi)對(dui)設備工作(zuo)造成的影響(xiang)。靜電(dian)(dian)(dian)(dian)放(fang)電(dian)(dian)(dian)(dian)時(shi)(shi)可以在 0.5-20ns 的時(shi)(shi)間內產生(sheng) 1-50A的放(fang)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流(liu)。雖然電(dian)(dian)(dian)(dian)流(liu)很大(da)但因持(chi)續時(shi)(shi)間很短,故能量較小。所(suo)以一般(ban)靜電(dian)(dian)(dian)(dian)放(fang)電(dian)(dian)(dian)(dian)不會對(dui)人產生(sheng)傷害,但對(dui)集成電(dian)(dian)(dian)(dian)路芯片(pian)等電(dian)(dian)(dian)(dian)子產品可能產生(sheng)破壞性的危害。
esd靜電放電發生(sheng)器是一(yi)種專門用于測(ce)試電子產品抗靜電能力的測(ce)試設備。它(ta)可(ke)以模擬靜電放(fang)電現象,對被測物進行放(fang)電測試,并檢測其(qi)耐(nai)靜電能力(li)是否符合相(xiang)關標準(zhun)和要求。
esd靜(jing)(jing)(jing)電(dian)(dian)(dian)(dian)(dian)(dian)放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)發(fa)生器一(yi)般由高壓(ya)(ya)電(dian)(dian)(dian)(dian)(dian)(dian)源(yuan)、放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)容(rong)和控制電(dian)(dian)(dian)(dian)(dian)(dian)路等組成。其放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)容(rong)貯存的能量(liang)可用(yong)于釋放(fang)(fang)一(yi)個(ge)瞬間的高電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)脈(mo)沖,模擬人體釋放(fang)(fang)靜(jing)(jing)(jing)電(dian)(dian)(dian)(dian)(dian)(dian)時(shi)(shi)帶來的電(dian)(dian)(dian)(dian)(dian)(dian)磁(ci)脈(mo)沖信號。同時(shi)(shi),ESD靜(jing)(jing)(jing)電(dian)(dian)(dian)(dian)(dian)(dian)放(fang)(fang)電(dian)(dian)(dian)(dian)(dian)(dian)發(fa)生器可以產生多個(ge)靜(jing)(jing)(jing)電(dian)(dian)(dian)(dian)(dian)(dian)脈(mo)沖,以便(bian)對被測物不同的防靜(jing)(jing)(jing)電(dian)(dian)(dian)(dian)(dian)(dian)措(cuo)施進行測試。
抗擾(rao)度試驗主要檢(jian)查人(ren)或物體在接觸設備時(shi)(shi)所引起(qi)的(de)(de)放電(dian)(dian)(dian)(dian)(直接放電(dian)(dian)(dian)(dian))以及(ji)人(ren)或物體對(dui)設備鄰(lin)近物體的(de)(de)放電(dian)(dian)(dian)(dian)(間接放電(dian)(dian)(dian)(dian))時(shi)(shi)對(dui)設備工作造成的(de)(de)影響。靜電(dian)(dian)(dian)(dian)放電(dian)(dian)(dian)(dian)時(shi)(shi)可以在 0.5-20ns 的(de)(de)時(shi)(shi)間內(nei)產(chan)生(sheng) 1-50A的(de)(de)放電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)流。雖然電(dian)(dian)(dian)(dian)流很(hen)(hen)大但因持(chi)續時(shi)(shi)間很(hen)(hen)短,故能(neng)量較小。所以一般靜電(dian)(dian)(dian)(dian)放電(dian)(dian)(dian)(dian)不會對(dui)人(ren)產(chan)生(sheng)傷(shang)害,但對(dui)集成電(dian)(dian)(dian)(dian)路芯片等電(dian)(dian)(dian)(dian)子產(chan)品可能(neng)產(chan)生(sheng)破壞性的(de)(de)危害。
試驗的測試等級為:
接觸放電 2kV,4kV,6kV,8kV;
空氣放電:2kV,4kV,8kV,15kV。
1、測試(shi)目的(de)
模擬操作人員或物體在接觸設備時產生的放電及人或物體對臨近物體的放電,以檢測受試設備抵抗靜電放電的抗干擾能力。
2、應用領域
1. 電(dian)(dian)子(zi)產品(pin)測(ce)試:ESD靜電(dian)(dian)放電(dian)(dian)發(fa)生器可用于電(dian)(dian)子(zi)產品(pin)的耐(nai)受性測(ce)試,如計算機、智能(neng)手機、平板電(dian)(dian)腦、電(dian)(dian)視等。
2. 汽(qi)(qi)車電(dian)(dian)子(zi)測試(shi):設備可以用于測試(shi)汽(qi)(qi)車電(dian)(dian)子(zi)的耐電(dian)(dian)靜電(dian)(dian)放(fang)電(dian)(dian)性能,比如汽(qi)(qi)車電(dian)(dian)子(zi)芯片、儀表盤(pan)等。
3. LED測試:在LED生(sheng)產(chan)中,設(she)備(bei)可(ke)以用來(lai)測試LED的靜電放(fang)電性能,如亮度(du)變(bian)化(hua)等(deng)。
4. 醫療器械測(ce)試(shi):設備可以用(yong)于(yu)醫療器械的靜電放(fang)電測(ce)試(shi),如心臟起(qi)搏器、血壓計等。
5. 電(dian)路板(ban)測試(shi):設(she)備(bei)可以用于測試(shi)電(dian)路板(ban)的靜電(dian)放(fang)電(dian)性能,如控制板(ban)、主(zhu)板(ban)等(deng)。
6. 光學設備(bei)(bei)測(ce)(ce)試:設備(bei)(bei)可以(yi)用于(yu)測(ce)(ce)試光學設備(bei)(bei)的(de)靜電放電性能,如光纖連接(jie)器、光學開關(guan)等。
7. 電(dian)力設備(bei)測試:在工(gong)業控(kong)制、通信等領域中,ESD靜(jing)(jing)電(dian)放電(dian)發生器可(ke)用于測試電(dian)力設備(bei)的靜(jing)(jing)電(dian)放電(dian)性能,如管道、閥門、變壓器等。
3、符(fu)合標準
Ø IEC 61000-4-2
Ø EN 61000-4-2
Ø GB/T 17626.2
Ø ISO 10605
Ø GB/T 19951
相關(guan)產品標準及(ji)企業標準
4、技術特點
Ø 主機自身可(ke)抵(di)抗20kV靜(jing)電放電測試;
Ø 靜電保持(chi)時間大(da)于5s ,符合標準(zhun)要求;
Ø 高(gao)壓精密阻容組合,使(shi)用壽命超長,并且方便(bian)更換,以滿(man)足(zu)不同標準的試驗要(yao)求(150pF、330pF、330Ω、2000Ω);
Ø 電壓(ya)漸升功能,方便客戶在開發產品時(shi)尋找(zhao)產品抗靜電的(de)臨界(jie)點;
Ø 主機觸發功能,配合校準過程(cheng)中使用,避免(mian)操作人員(yuan)對校準波形造成影響;
Ø 聲光報警(jing)裝置,明確顯示(shi)有無空(kong)氣放電過程發生(sheng);
Ø 采用7寸(cun)觸(chu)摸液(ye)晶顯示屏,具有高抗(kang)干擾性能,通過觸(chu)摸完成(cheng),操作(zuo)簡潔快速;
Ø 采用進口放電開關(guan)及(ji)HPS內嵌(qian)和多級補償控制技(ji)術,電壓精準度(du)及(ji)波形光滑度(du);
Ø 靜電(dian)發生器外部(bu)配有槍托,便于放置靜電(dian)槍槍體與(yu)放電(dian)電(dian)極;
Ø 組合測(ce)試機(ji)制,方便(bian)客戶進行不同參數的連續測(ce)試;
Ø 配(pei)有文件(jian)管理系統,可以保存常(chang)用測(ce)試(shi)(shi)參(can)數,也可以通過U盤導入(ru)、導出(chu)測(ce)試(shi)(shi)參(can)數;
Ø 配有(you)以(yi)太網口,可以(yi)通(tong)過(guo)遠程控制操作。
5、主要技術參(can)數
產品型號 | SKS-0220I |
輸出電壓 | 100V~20kV±5% |
輸(shu)出電壓極性(xing) | 正 負(fu) 正負(fu)交替 |
儲能電容(rong) | 150pF±10%(可更(geng)換) |
放電(dian)電(dian)阻 | 330Ω±5%(可更(geng)換) |
放電(dian)電(dian)流上升時間 | 0.8ns±25% |
工作(zuo)模式(shi) | IEC等(deng)級(ji):內置LEVEL1~LEVEL4四個標(biao)準(zhun)試驗等(deng)級(ji) |
用戶(hu)設定:用戶(hu)可(ke)以自定義所有參數,可(ke)以分(fen)別保(bao)存50組自定義參數 | |
電(dian)壓(ya)漸升:根據(ju)設(she)置放(fang)電(dian)間隔、放(fang)電(dian)次數(shu),放(fang)電(dian)完成后設(she)備自動停止 | |
放電(dian)模式 | 空氣放電、接觸放電 |
放電方式 | 扳(ban)機(ji)單次放電、扳(ban)機(ji)連續(xu)放電 、主(zhu)機(ji)單次放電、主(zhu)機(ji)連續(xu)放電 |
單次(ci)設定放電次(ci)數 | 1~9999 |
放電間隔 | 0.05~9.99s 步進為:0.01s |
儀器工作電源 | AC220V±10% 50/60Hz |
尺寸(W×D×H) | 328mm×320mm×185mm |
重量(liang) | 約8kg |
6、靜電放電測(ce)試環境
針(zhen)對(dui)靜電(dian)(dian)放電(dian)(dian)試(shi)驗專(zhuan)門(men)設計的(de)(de)(de),符(fu)合(he)(he)最新標準的(de)(de)(de)要(yao)求,對(dui)提(ti)高靜電(dian)(dian)放電(dian)(dian)試(shi)驗的(de)(de)(de)重復性和可比性有重要(yao)作用,是臺(tai)式設備和落地式設備的(de)(de)(de)組合(he)(he)。靜電(dian)(dian)放電(dian)(dian)測試(shi)環境包括:試(shi)驗臺(tai)、參考接地平板(ban)、水平耦合(he)(he)板(ban)、垂直耦合(he)(he)板(ban)、絕緣襯墊、接地電(dian)(dian)阻、絕緣支撐等。
臺式設備配置ESD-GS-A(D) | ||||||
名稱 | 型號 | 規格(ge) | 數量 | |||
試驗(yan)桌(zhuo) | ESD-TABLE | 1600×800×800mm | 1 | |||
參考接地板 | ESD-GRP | 2700×1800×1.0mm | 1 | |||
臺式垂(chui)直(zhi)耦(ou)合板 | ESD-TVCP | 500×500×1.5mm | 1 | |||
水平(ping)耦合板 | ESD-HCP | 1600×800×1.5mm | 1 | |||
絕緣(yuan)襯墊 | ESD-IS(0.5) | 1400×600×0.5mm | 1 | |||
電(dian)阻電(dian)纜(lan) | ESD-RW(470K) | 470kΩ×2,2m | 2 |